STUDY OF CdSe THIN LAYERS AS WINDOW LAYERS IN SOLAR CELLS USING SPECTROSCOPIC ELLIPSOMETRIC METHOD
Kh.N. Ahmadova1,2, L.N. Ibrahimova3
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ABSTRACT

In this work, the optical properties of CdSe thin films grown on glass substrates were studied by spectroscopic ellipsometry. The prepared samples were measured at room temperature in the photon energy range of 1.5-7.0 eV on an M-2000 rotation-compensated spectroscopic ellipsometer. The spectral dispersion of optical constants was obtained using an appropriate dispersion model. The thickness, dielectric permittivity (real and imaginary parts), refractive and extension coefficients of the thin films were calculated. High transparency was observed depending on the size of the CdSe thin films. The width of the forbidden zone was determined for samples with a thickness of 350 and 400 nm obtained by the chemical deposition method.

Keywords: Spectroscopic Ellipsometry, CdSe, thin films, optical constants.
DOI:10.70784/azip.2.2025220

Received: 22.04.2025
Internet publishing: 29.04.2025    AJP Fizika A 2025 02 az p.20-23

AUTHORS & AFFILIATIONS

1. Institute of Physics Ministry of Science and Education Republic of Azerbaijan, 131 H.Javid ave. Baku, AZ 1073, Azerbaijan
2. Azerbaijan State Oil and Industry University, Baku, AZ 1010, Azerbaijan
3. Nakhchivan State University University Campus, Nakhchivan 7012
E-mail: khuramanahmadova85@gmail.com

Graphics and Images

         

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