Institute of Physics Ministry of Science and Education Republic of Azerbaijan

STRUCTURAL ANALYSIS OF TlInTe₂ - InGaTe₂ SOLID SOLUTIONS BY X-RAY DIFFRACTION

Kh.O. Sadiq

ABSTRACT

In this work, the structural properties of TlIn_1-xGa_xTe₂ solid solutions were investigated by X-ray diffraction. Samples with different compositions (x=0-0.8) were synthesized and their crystal structure parameters were determined using a DRON-2 diffractometer with CuKά radiation and a nickel filter. The results show that the solid solutions crystallize in a tetragonal lattice. With increasing Ga content, the unit cell parameters decrease systematically due to the higher ionicity and stronger hybridization of Ga atoms compared to Tl. At approximately x≈ 0.5, the X-ray diffraction pattern reveals the formation of a new quaternary phase, TlIn₂GaTe₄, with distinct structural characteristics compared to the initial compounds. The observed trends are explained by changes in the electronic configuration of the outer shells of Tl and Ga atoms, which modify the chemical bonding and the band gap of the material. These findings contribute to the understanding of phase formation and structure–property relations in Tl-based telluride solid solutions.

Keywords: solid solutions, tetragonal lattice, X-ray diffraction, unit-cell parameters, quaternary phase
DOI:10.70784/azip.1.2025320

Received: 25.08.2025
Internet publishing: 03.09.2025 AJP Fizika E 2025 03 en p.20-22

AUTHORS & AFFILIATIONS

Azerbaijan State Oil and Industry University, AZ1010, Azadliq str., 20
E-mail: sadigxaver20@gmail.com

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