STRUCTURAL ANALYSIS OF Al AND Fe3O4 BASED THIN FILMS USING POSITRON ANNIHILATION TECHNIQUES
Kh.N. Ahmadova1,2
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ABSTRACT

Thin films of Al (60 and 100 nm), Fe3O4 (120 nm), and their combined composite layer (220 nm) were synthesized using epitaxial deposition techniques. Microstructural features and vacancy-type defects in the prepared samples were examined by Doppler Broadening Positron Annihilation Spectroscopy. Analysis of the measured spectra provided the energy dependence of the S and W parameters. The results indicate that the predominant defects in Al and Fe3O4 films are linear in nature, whereas the data for the Al–Fe3O4 composite suggest the presence of vacancy-type centers.

Keywords: Positron annihilation, Doppler broadening, thin layers.
DOI:10.70784/azip.2.2025411

Received: 18.11..2025
Internet publishing: 25.11.2025    AJP Fizika A 2025 04 az p.11-14

AUTHORS & AFFILIATIONS

1. Institute of Physics Ministry of Science and Education Republic of Azerbaijan, 131 H.Javid ave, Baku, AZ-1073, Azerbaijan
2. Azerbaijan State Oil and Industry University, Baku, AZ 1010, Azerbaijan
E-mail: khuramanahmadova85@gmail.com

Graphics and Images

       

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