COMPARATIVE STUDY OF STRUCTURAL AND ELECTRO-OPTICAL PROPERTIES OF CuInSe2 THIN FILMS IN THE COLD MICROPLASMA DEVICE
B.G. Salamov
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ABSTRACT

The study investigates the impact of plasma-surface interaction on the structural, optical, and electrical properties of CuInSe2 (CIS) thin films. The films were characterized using various methods, including atomic force microscopy, X-ray diffraction, absorbance, transmission, and electrical measurements. The results show that plasma treatment significantly affects the electrical and optical properties of CIS films. The treatment increases transmission, decreases the absorption coefficient, and decreases band gap energy values from 1.05 to 0.88 eV. The resistivity values of CIS films at room temperature decrease by three orders of magnitude after plasma treatment. A planar cold microplasma device was used to visualize and record resistance inhomogeneity and photoconductivity distribution in a CuInSe2 copper-indium-diselenide film. The plasma-induced damage (PID) in a CuInSe2 film is primarily attributed to the efficacy of sputtering and physicochemical interactions within the discharge gap during the transition from Townsend to glow discharge. A nondestructive method was proposed for analyzing the kinetics of PID in the CuInSe2 film using fractal processing within the planar cold microplasma device. Fractal dimension analysis was employed to quantitatively assess the alterations in dynamic characteristics of the PID of CuInSe2 thin films. The film's quality was assessed through profile and spatially dispersed DLE intensity data, revealing surface inhomogeneity and degradation over time.

Keywords: CuInSe2, X-ray diffraction, plasma-induced damage, thin film, discharge light emission, fractal dimension.
DOI:10.70784/azip.1.2025356

Received: 12.09.2025
Internet publishing: 24.09.2025    AJP Fizika E 2025 03 en p.56-66

AUTHORS & AFFILIATIONS

Institute of Physics, Ministry of Science and Education of the Republic of Azerbaijan, 131 H. Javid Ave., Baku, AZ-1073, Azerbaijan
E-mail:

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